Benchtop x-ray diffractometer for routine analysis
Quality control and quality assurance in industrial laboratories require precise and reliable methods for crystalline phase analysis. In these environments, fast and accurate data collection for X-ray diffraction (XRD) is essential to maintain high standards and meet regulatory requirements.
Execute rapid and precise Xrd analysis
The ARL X’TRA Companion by Thermo Fisher Scientific is a benchtop X-ray diffractometer designed for routine and advanced XRD analysis. Its θ/θ Bragg-Brentano geometry and solid-state 2D detector ensure high-resolution data collection within minutes. The device features one-click Rietveld quantification and automated result transmission to a LIMS, complying with international X-ray safety regulations. It is equipped with a goniometer with stepping motors and optical encoders, mechanical slits, Soller Slits, a variable beam knife, and a solid-state pixel detector for fast and resolute data collection. The diffractometer supports both qualitative and quantitative crystalline phase analysis, as well as the determination of cell parameters, crystallite size, and lattice strain. Suitable for various fields such as cement, materials science, minerals, geology, nanomaterials, chemicals, pharmaceuticals, energy materials, catalysts, ceramics, polymers, metallurgy, semiconductors, and mining.
Benefits
- High-resolution data collection within minutes
- One-click Rietveld quantification for ease of use
- Automated result transmission to LIMS
- Compliance with international X-ray safety regulations
- Suitable for a wide range of applications